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Position: Senior scientist. Institution attended: V.Lashkarev Institute of Semiconductor Physics of NASU. Scientific interests: Plasmonics, near-field optics, tip-enhanced Raman scattering, ellipsometry, optical properties of nanocomposites, energy transfer. |
Lecture title: SNOM+SERS=TERS and how to get more from this equation.
Lecture abstract: The talk gives an introduction to the unique optical method of the material investigations with nanometer resolution – so-called tip-enhanced Raman scattering (TERS). Combining the resolution of scanning near-field optical microscopy (SNOM) and the sensitivity of surface enhanced Raman scattering (SERS), it allows to obtain the information about the investigated system which no other method can provide. Background of the optical sub-diffraction resolution of SNOM as well as of the enhancement allowing to detect specimen by Raman fingerprint to the molecular level is highlighted. In the addition of the general discussion of those methods questions of the use of functionalized probes in SNOM are considered and the profit of the implementation of such probes is discussed. The new concept of the Raman probe is introduced and the sensitivity of such a probe to the local environment is demonstrated [1] as well as promising perspectives are discussed. As the first application of such probes, the realization of an internal standard for TERS is demonstrated [2]. In collaboration with U. Fischer (Uni Münster, Germany), T. Schmid, and R. Zenobi (ETH Zürich, Switzerland). [1] E. G. Bortchagovsky and U. C. Fischer, Nanoscale 4, 885 (2012). [2] E. Bortchagovsky, T. Schmid and R. Zenobi, Appl. Phys. Lett., 103 (2013) 043111-1-3.