Nanooptics and photonics 
Theoretical and experimental total internal reflection investigation of multilayered metal-dielectric structure
Ilchenko S.G.1, Lymarenko R.A.1, Taranenko V.B.1, Kyžas N. 2,   Belosludtsev A.2
1 International Center “Institute of Applied Optics” National Academy of Science of Ukraine10G Kudryavska street, Kyiv, 04053, Ukraine.
E-mail: Svitlana-ilchenko@ukr.net
2 Optical Coating Laboratory Center for Physical Sciences and Technology Savanoriu ave. 231, Vilnius 02300 Lithuania

In this work, the multilayered metal-dielectric structure is investigated theoretically and experimentally. The condition of total internal reflection at the interface between the multilayer structure and external homogeneous medium was previously studied [1, 2]. Suggested coating structure was deposited by magnetron sputtering with in-situ film growing monitoring [3]. The coating structure consists of three pairs of quarter-wavelength thick dielectric layers combination of high (niobium oxide) - low (silicon oxide) refractive indices materials and 40 nm silver layer on top. 
We show that such structure exhibits two resonant dips in reflection (with width of about 20 mrad) for TM polarization. The dips properties (the optical field distribution at the metal-dielectric interface and width of the dip in reflection) are similar to a well-known surface plasmon polariton resonance for three-layer Kretschmann structure. For TE polarization our structure has very narrow resonant dip of 170 µrad. The reason is waveguide modes propagating along the structure. A significant resonant enhancement of the evanescent wave at the interface between the multilayer structure and the external homogeneous medium was also measured and investigated.
Possible applications of the suggested metal-dielectric structures for sensorics, filtering and laser modulation will be discussed. 

1.	Ilchenko S. G., Lymarenko R. A., Taranenko V. B. Metal-Multilayer-Dielectric Structure for Enhancement of s- and p-Polarized Evanescent Waves // Nanoscale Research Letters. -  2016. - 11:42 (1 February 2016) DOI:  10.1186/s11671-016-1274-3.
2.	Ilchenko S. G., Lymarenko R. A., Taranenko V. B.  Using Metal-Multilayer-Dielectric Structure to Increase Sensitivity of Surface Plasmon Resonance Sensor // Nanoscale Research Letters 12(1), DOI: 10.1186/s11671-017-2073-1 
3.	Belosludtsev A., Kyžas N., Real-time in-situ investigation of copper ultrathin films growth Mater. Lett., 232 (2018), pp. 216-219, https://doi.org/10.1016/j.matlet.2018.08.127.