Thematic area: “Nanoscale physics”; “Nanocomposites & nanomaterials”
Complementary techniques for characterization of various (Ga,Mn)(Bi,As) DMS thin layers
K. Levchenko1, T. Prokscha2, J.Z. Domagała1, J. Sadowski1,3, P. Dłużewski1, A. Kaleta1, R. Jakieła1, M. Trzyna4, T. Andrearczyk1 and T. Wosinski1

1 Institute of Physics, Polish Academy of Sciences, PL-02668 Warsaw, Poland
2 Paul Scherrer Institute, Laboratory for Muon Spin Spectroscopy, CH-5232 Villigen, Switzerland
3 Department of Physics and Electrical Engineering, Linnaeus University, SE-391 82 Kalmar, Sweden.
 4 Faculty of Mathematics and Natural Sciences, University of Rzeszów, PL-35310 Rzeszów, Poland

Evaluation of the structure quality is a vital first step in any research of a new material, bringing it closer toward implementation and application. Even while using high-quality growth technique, like low-temperature molecular-beam epitaxy (LT-MBE), a further comprehensive analysis of the structure homogeneity and composition is important. 
During our presentation we’d like to show versatile complementary spectroscopy and microscopy techniques that were used to describe structure parameters of (Ga,Mn)(Bi,As) (6% Mn, 1% Bi) dilute magnetic semiconductor (DMS) 50-nm-thick layers [1]. High-resolution X-ray diffractometry provided detailed insight into the structure quality and crystal lattice parameters along with the strain in the top investigated layer. Secondary ion mass spectroscopy (SIMS) determined elements distribution throughout the epitaxial layers, while high-resolution transmission electron microscopy (HR-TEM) visualized fine structure of the lattice. Superconducting quantum interference device (SQUID) magnetometry was used as a primary tool for phase transition and magnetic anisotropy investigations, together with a unique muon spin relaxation (µSR) spectroscopy [2]. Special attention will be paid to the low-energy fully spin-polarized muons analysis, conducted in Paul Scherrer Institute, as a powerful technique for the evaluation of the spatially-resolved (with nm resolution) magnetization homogeneity of the DMS layers.

This work was supported in part by National Science Centre (Poland) through grants UMO-2016/23/N/ST3/03501 and DEC-2012/07/B/ST5/02080. 

[1]	 K. Levchenko, T. Andrearczyk, J. Z. Domagała, J. Sadowski, L. Kowalczyk, M. Szot, R. Kuna, T. Figielski and T. Wosinski //J. Supercond. Nov. Magn. 30, 825-829 (2017);
[2]	 K. Levchenko, T. Prokscha, J. Sadowski, I. Radelytskyi, R. Jakiela, M. Trzyna, T. Andrearczyk, T. Figielski and T. Wosinski// Scientific Reports 9:3394 (2019).