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To characterize quality
of LC alignment quantitatively, we use optical scheme shown below. In this
scheme, light transmittance of a probe beam of semiconductor laser (λ = 0.532 µm) through the sample set between two
polarizers is measured. At first polarizers are crossed and the sample position
is automatically adjusted to get a minimal transparency. In this geometry the
intensity of the probe beam behind the analyzer, I┴, is measured. Then, analyzer is
rotated for 90o and the intensity of the probe beam, III,
behind the analyzer is measured again. The ratio Q= ( III - I┴ )
/ ( I┴ + III ) is
estimated and considered as the aligning quality parameter.
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